dc.contributor.author | GÖKÇE, AYTAÇ GÜRHAN | |
dc.date.accessioned | 2015-11-20T13:37:18Z | NULL |
dc.date.available | 2015-11-20T13:37:18Z | NULL |
dc.date.issued | 2002 | |
dc.identifier.uri | http://hdl.handle.net/20.500.12397/8950 | NULL |
dc.description.abstract | en_US | |
dc.language.iso | en | en_US |
dc.publisher | DEÜ Fen Bilimleri Enstitüsü | en_US |
dc.subject | Kristal yapı, Crystal structure, Kristalografi, Crystallography, Tek kristaller, Single crystals, X ışını kırınımı, X ray diffraction, Schiff bazları, Schiff bases | en_US |
dc.title | The Crystal structure analysis of C28H24N2O4 and C23H32N4Se by single crystal x ray diffraction technique | en_US |
dc.title.alternative | en_US | |
dc.type | Thesis | en_US |